Defects and Charge-Trapping Mechanisms of Double-Active-Layer In–Zn–O and Al–Sn–Zn–In–O Thin-Film Transistors

Author

Youngin Goh, Taeho Kim, Jong-Heon Yang, Ji Hun Choi, Chi-Sun Hwang, Sung Haeng Cho, Sanghun Jeon

Journal

ACS Applied Materials & Interfaces

Vol

9

Page

9271-9279

Year

2017

Link

https://pubs.acs.org/doi/full/10.1021/acsami.7b01533 71회 연결